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IEC PAS 62206:2000 ed1.0

Заменен
Power and temperature cycling — 5 стр.
Aims at determining the ability of a device to withstand alternate exposures at high and low temperature extremes with operating biases periodically applied and removed. It is intended to simulate worst case conditions encountered in typical applications and considered destructive.
ICS
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом