Evaluation of thickness, density and interface width of thin films by X-ray reflectometry -- Instrumental requirements, alignment and positioning, data collection, data analysis and reporting— 38 стр.
35.240.70 IT applications in science. Including digital geographic information / Применение информационных технологий в науке. Включая цифровую географическую информацию
71.040.40 Chemical. Including analysis of gases and surface chemical analysis / Химический анализ. Включая анализ газов
