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ÖVE/ÖNORM EN 60749-20-1:2009-12

Действует
Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat (IEC 60749-20-1:2009) (english version)
ICS
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом