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ÖVE/ÖNORM EN 60749-30:2012-02

Действует
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2005 + A1:2011) (english version)
ОписаниеИзмененияСсылкиВерсии

Ссылочные документы

IEC 60749-4:2002/COR1:2003 ed1.0
Заменен
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) — 0 стр.
IEC 60749-5:2017 ed2.0
Заменен
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test — 9 стр.
IEC 60749-11:2002/COR1:2003 ed1.0
Действует
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method — 0 стр.
IEC 60749-20:2008 ed2.0
Заменен
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat — 53 стр.
IEC 60749-24:2004 ed1.0
Действует
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST — 19 стр.
IEC 60749-25:2003 ed1.0
Действует
Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling — 25 стр.
IEC 60749-33:2004 ed1.0
Действует
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave — 17 стр.
BS EN 60749-4:2002
Заменен
Semiconductor devices. Mechanical and climatic test methods. Damp heat, steady state, highly accelerated stress test (HAST) — 12 стр.
BS EN 60749-5:2003
Заменен
Semiconductor devices. Mechanical and climatic test methods. Steady-state temperature humidity bias life test — 12 стр.
BS EN 60749-11:2002
Действует
Semiconductor devices. Mechanical and climatic test methods. Rapid change of temperature. Two-fluid-bath method — 12 стр.
BS EN 60749-20:2009
Действует
Semiconductor devices. Mechanical and climatic test methods. Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat — 30 стр.
BS EN 60749-24:2004
Действует
Semiconductor devices. Mechanical and climatic test methods. Accelerated moisture resistance. Unbiased HAST — 10 стр.
BS EN 60749-25:2003
Действует
Semiconductor devices. Mechanical and climatic test methods. Temperature cycling — 16 стр.
BS EN 60749-33:2004
Действует
Semiconductor devices. Mechanical and climatic test methods. Accelerated moisture resistance. Unbiased autoclave — 10 стр.