Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates (IEC 62047-22:2014) (english version)
Plastics - Determination of tensile properties - Part 3: Test conditions for films and sheets (ISO 527-3:1995); German version EN ISO 527-3:1995— 6 стр.