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ÖVE/ÖNORM EN 62149-8:2014-12

Действует
Fibre optic active components and devices - Performance standards - Part 8: Seeded reflective semiconductor optical amplifier devices (IEC 62149-8:2014) (english version)
ОписаниеИзмененияСсылкиВерсии

Ссылочные документы

IEC 60749-6:2002 ed1.0
Заменен
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature — 7 стр.
IEC 60749-7:2002/COR1:2003 ed1.0
Заменен
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases — 0 стр.
IEC 60749-10:2002/COR1:2003 ed1.0
Заменен
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock — 0 стр.
IEC 60749-11:2002/COR1:2003 ed1.0
Действует
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method — 0 стр.
IEC 60749-12:2002 ed1.0
Заменен
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency — 7 стр.
IEC 60749-25:2003 ed1.0
Действует
Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling — 25 стр.
IEC 60749-26:2003 ed1.0
Заменен
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) — 27 стр.
IEC 60825-1:1993+AMD1:1997+AMD2:2001 CSV ed1.2
Заменен
Safety of laser products - Part 1: Equipment classification, requirements and user's guide — 115 стр.
IEC 61300-2-4:2019 RLV ed2.0
Действует
Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-4: Tests - Fibre or cable retention — 44 стр.
IEC 61300-2-19:2012 ed3.0
Действует
Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-19: Tests - Damp heat (steady state) — 17 стр.
IEC 61300-2-48:2003 ed1.0
Заменен
Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-48: Tests - Temperature-humidity cycling — 17 стр.
BS EN 60749-6:2017
Действует
Semiconductor devices. Mechanical and climatic test methods. Storage at high temperature — 12 стр.
BS EN 60749-7:2011
Действует
Semiconductor devices. Mechanical and climatic test methods. Internal moisture content measurement and the analysis of other residual gases — 14 стр.
BS EN 60749-10:2002
Действует
Semiconductor devices. Mechanical and climatic test methods. Mechanical shock — 8 стр.
BS EN 60749-11:2002
Действует
Semiconductor devices. Mechanical and climatic test methods. Rapid change of temperature. Two-fluid-bath method — 12 стр.
BS EN 60749-12:2002
Заменен
Semiconductor devices. Mechanical and climatic test methods. Vibration, variable frequency — 8 стр.
BS EN 60749-25:2003
Действует
Semiconductor devices. Mechanical and climatic test methods. Temperature cycling — 16 стр.
BS EN 60749-26:2014
Заменен
Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM) — 42 стр.
BS EN 60825-1:2014
Действует
Safety of laser products. Equipment classification and requirements — 112 стр.
BS EN 60950-1:2006
Заменен
Information technology equipment. Safety. General requirements — 318 стр.
BS EN 61300-2-4:1997
Действует
Fibre optic interconnecting devices and passive components. Basic test and measurement procedures. Tests. Fibre/cable retention — 10 стр.
BS EN 61300-2-19:2013
Действует
Fibre optic interconnecting devices and passive components. Basic test and measurement procedures. Tests. Damp heat (steady state) — 12 стр.
BS EN 61300-2-48:2009
Действует
Fibre optic interconnecting devices and passive components. Basic test and measurement procedures. Tests. Temperature-humidity cycling — 12 стр.