Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification (IEC 62575-1:2015); German version EN 62575-1:2016— 40 стр.
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification (IEC 62604-1:2015); German version EN 62604-1:2015— 34 стр.
Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency (IEC 61338-1-5:2015); German version EN 61338-1-5:2015— 23 стр.
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2016); German version EN 62276:2016— 45 стр.
Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules (IEC 61240:2016); German version EN 61240:2017)— 20 стр.
Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency (IEC 61338-1-4:2005); German version EN 61338-1-4:2006— 32 стр.
Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections (IEC 60679-3:2012); German version EN 60679-3:2013— 26 стр.
Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyser techniques and error correction (IEC 60444-5:1995); German version EN 60444-5:1997— 38 стр.
Piezoelectric filters of assessed quality - Part 1: Generic specification (IEC 60368-1:2000 + A1:2004); German version EN 60368-1:2000 + A1:2004— 38 стр.
Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values (IEC 60689:2008); German version EN 60689:2009— 20 стр.
Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification; capability approval (IEC 60679-4-1:1998); German version EN 60679-4-1:1998— 8 стр.
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units (IEC 60444-2:1980); German version EN 60444-2:1997— 9 стр.
