ASTM E1894-24

Действует

Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources — 19 стр.

Ссылочные документы

ASTM E1249-15(2021)

Действует

Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources — 17 стр.

ASTM E668-20

Действует

Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices — 19 стр.

ASTM E170-24

Действует

Standard Terminology Relating to Radiation Measurements and Dosimetry — 12 стр.

ASTM E666-21

Действует

Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation — 9 стр.

ASTM E1894-18

Заменен

Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources — 19 стр.

На этот документ ссылаются

ASTM F980-16(2024)

Действует

Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices — 7 стр.

ASTM F773M-16

Отменен

Standard Practice for Measuring Dose Rate Response of Linear Integrated Circuits (Metric) (Withdrawn 2023) — 6 стр.

ASTM E1894-13a

Заменен

Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources — 19 стр.

ASTM E1894-97(2002)

Заменен

Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources — 17 стр.

ASTM E1894-13

Заменен

Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources — 19 стр.

ASTM E1894-08

Заменен

Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources — 19 стр.

ASTM E1894-97

Заменен

Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources — 17 стр.

ASTM E1894-18

Заменен

Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources — 19 стр.

ASTM F526-21

Действует

Standard Test Method for Using Calorimeters for Total Dose Measurements in Pulsed Linear Accelerator or Flash X-ray Machines — 13 стр.

ASTM F1893-18

Отменен

Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices (Withdrawn 2023) — 7 стр.

ASTM F1467-18

Действует

Standard Guide for Use of an X-Ray Tester ("48;10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits — 18 стр.

ASTM F744M-16

Отменен

Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric) (Withdrawn 2023) — 7 стр.

ASTM F996-11(2018)

Отменен

Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current–;Voltage Characteristics (Withdrawn 2023) — 7 стр.