ASTM E2245-11e1

Заменен

Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer — 25 стр.

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Ссылочные документы

ASTM E2246-11e1

Заменен

Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer — 21 стр.

ASTM E2530-06

Отменен

Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si(111) Monatomic Steps (Withdrawn 2015) — 6 стр.

ASTM E2444-11e1

Заменен

Terminology Relating to Measurements Taken on Thin, Reflecting Films — 2 стр.

ASTM E2244-11e1

Заменен

Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer — 14 стр.

ASTM E2245-11(2018)

Отменен

Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer (Withdrawn 2023) — 25 стр.

ASTM E2245-11

Заменен

Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer — 24 стр.

На этот документ ссылаются

ASTM E2444-11e1

Заменен

Terminology Relating to Measurements Taken on Thin, Reflecting Films — 2 стр.

ASTM E2245-11

Заменен

Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer — 24 стр.

ASTM E2246-11e1

Заменен

Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer — 21 стр.

ASTM E2245-11(2018)

Отменен

Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer (Withdrawn 2023) — 25 стр.

ASTM E2244-11e1

Заменен

Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer — 14 стр.