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ASTM E2530-06

Отменен
Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si(111) Monatomic Steps (Withdrawn 2015) — 6 стр.
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Ссылочные документы

ASTM E2530-06
Отменен
Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si(111) Monatomic Steps (Withdrawn 2015) — 6 стр.

На этот документ ссылаются

PD ISO/TR 19716:2016
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PD ISO/TR 18196:2016
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Nanotechnologies. Measurement technique matrix for the characterization of nano-objects — 66 стр.
ASTM E2530-06
Отменен
Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si(111) Monatomic Steps (Withdrawn 2015) — 6 стр.
ASTM E2859-11
Заменен
Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy — 9 стр.
ASTM E2859-11(2017)
Заменен
Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy — 9 стр.
ASTM E2244-11
Заменен
Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer — 11 стр.
ASTM E2246-11
Заменен
Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer — 21 стр.
ASTM E2245-11e1
Заменен
Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer — 25 стр.
ASTM E2245-11
Заменен
Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer — 24 стр.
ASTM E2244-11(2018)
Отменен
Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer (Withdrawn 2023) — 14 стр.
ASTM E2246-11e1
Заменен
Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer — 21 стр.
ASTM E2245-11(2018)
Отменен
Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer (Withdrawn 2023) — 25 стр.
ASTM E2246-11(2018)
Отменен
Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer (Withdrawn 2023) — 21 стр.
ASTM E2244-11e1
Заменен
Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer — 14 стр.
ASTM E2859-11(2023)
Действует
Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy — 9 стр.