ASTM E666-21

Действует

Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation — 9 стр.

Ссылочные документы

Действует

Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices — 19 стр.

ASTM E170-24

Действует

Standard Terminology Relating to Radiation Measurements and Dosimetry — 12 стр.

ASTM E1249-15(2021)

Действует

Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources — 17 стр.

ASTM E666-14

Заменен

Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation — 9 стр.

На этот документ ссылаются

ASTM E1819-15(2021)

Действует

Standard Guide for Environmental Monitoring Plans for Decommissioning of Nuclear Facilities — 9 стр.

ASTM E666-14

Заменен

Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation — 9 стр.

ASTM E1161-09(2014)

Заменен

Standard Practice for Radiologic Examination of Semiconductors and Electronic Components — 10 стр.

ASTM F1262M-14

Отменен

Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) (Withdrawn 2023) — 6 стр.

ASTM E2450-16

Заменен

Standard Practice for Application of CaF<inf>2</inf>(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments — 6 стр.

ASTM D1879-06(2014)

Заменен

Standard Practice for Exposure of Adhesive Specimens to Ionizing Radiation — 5 стр.

ASTM F980-16

Заменен

Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices — 7 стр.

ASTM F980M-96(2003)

Заменен

Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices [Metric] — 5 стр.

ASTM F996-11(2018)

Отменен

Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current–;Voltage Characteristics (Withdrawn 2023) — 7 стр.

ASTM F980-16(2024)

Действует

Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices — 7 стр.

ASTM F744M-16

Отменен

Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric) (Withdrawn 2023) — 7 стр.

ASTM F773M-16

Отменен

Standard Practice for Measuring Dose Rate Response of Linear Integrated Circuits (Metric) (Withdrawn 2023) — 6 стр.

ASTM E1894-18

Заменен

Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources — 19 стр.

ASTM F1892-12(2018)

Действует

Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices — 41 стр.

ASTM F1467-18

Действует

Standard Guide for Use of an X-Ray Tester ("48;10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits — 18 стр.

ASTM E1401-96e1

Заменен

Standard Practice for Use of a Dichromate Dosimetry System (Withdrawn 2002) — 6 стр.

ASTM E1538-99e1

Заменен

Standard Practice for Use of the Ethanol-Chlorobenzene Dosimetry System (Withdrawn 2002) — 10 стр.

ASTM E1956-21

Действует

Standard Practice for Use of a Thermoluminescence-Dosimetry System (TLD System) for Radiation Processing — 8 стр.

ASTM E1401-21

Действует

Standard Practice for Use of a Dichromate Dosimetry System — 7 стр.

ASTM E1249-15(2021)

Действует

Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources — 17 стр.

ASTM E1894-24

Действует

Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources — 19 стр.

ASTM E1631-96e1

Заменен

Standard Practice for Use of Calorimetric Dosimetry Systems for Electron Beam Dose Measurements and Dosimeter Calibrations (Withdrawn 2002) — 9 стр.

ASTM E1205-99

Заменен

Standard Practice for Use of a Ceric-Cerous Sulfate Dosimetry System (Withdrawn 2002) — 11 стр.

ASTM E668-20

Действует

Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices — 19 стр.

ASTM E1956-98

Заменен

Standard Practice for Use of Thermoluminescence-Dosimetry (TLD) Systems for Radiation Processing (Withdrawn 2002) — 8 стр.

ASTM E2381-04(2010)

Отменен

Standard Guide for Dosimetry In Radiation Processing of Fluidized Beds and Fluid Streams (Withdrawn 2016) — 9 стр.

ASTM E1026-13

Заменен

Standard Practice for Using the Fricke Dosimetry System — 9 стр.

ASTM D1879-06(2023)

Действует

Standard Practice for Exposure of Adhesive Specimens to Ionizing Radiation — 5 стр.

ASTM E1854-19

Действует

Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts — 13 стр.

ASTM E2450-23

Действует

Standard Practice for Application of CaF<inf>2</inf>(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments — 6 стр.

ASTM E1161-21

Действует

Standard Practice for Radiographic Examination of Semiconductors and Electronic Components — 11 стр.