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DIN 50440:1998-11

Отменен
Testing of materials for semiconductor technology - Measurement of carrier lifetime in silicon single crystals - Recombination carrier lifetime at low injection by photoconductivity method — 8 стр.
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Ссылочные документы

DIN IEC 60469-1:1991-05
Отменен
Pulse techniques and apparatus; part 1: pulse terms and definitions; identical with IEC 60469-1:1987
DIN 19226-2:1994-02
Отменен
Control technology; terms and definitions; dynamic systems behaviour — 18 стр.
ASTM F2817-10
Заменен
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DIN 50440-1:1981-11
Отменен
Testing of materials for semiconductor technology; measurement of recombination carrier lifetime in silicon single crystals by means of photo conductive decay method; measurement on bar-shaped specimens — 5 стр.

На этот документ ссылаются

DIN 50440-1:1981-11
Отменен
Testing of materials for semiconductor technology; measurement of recombination carrier lifetime in silicon single crystals by means of photo conductive decay method; measurement on bar-shaped specimens — 5 стр.