DIN 50454-3:1994-10

Отменен

Testing of materials for semiconductor technology - Determination of the dislocation etch pits density in monocrystals of III-V-compound semiconductors - Part 3: Gallium phosphide — 2 стр.

Описание Изменения Ссылки Версии

Ссылочные документы

DIN 50433-1:1976-12

Отменен

Testing of semi-conducting inorganic materials; determining the orientation of single crystals by means of X-ray diffraction — 3 стр.

DIN 50454-1:1991-11

Отменен

Testing of materials for semiconductor technology; determination of the dislocations etch pits density in monocrystals of III-V-compound semiconductors; galliumarsenide — 4 стр.