IEC 60749-28:2017 ed1.0

Заменен

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level — 97 стр.

Описание Изменения Ссылки Версии

Ссылочные документы

IEC 60749-28:2022 ed2.0

Действует

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level — 98 стр.

IEC PAS 62162:2000 ed1.0

Заменен

Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components — 7 стр.

На этот документ ссылаются

BS EN 62604-1:2015

Действует

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality. Generic specification — 38 стр.

BS EN 62575-1:2016

Действует

Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality. Generic specification — 42 стр.

BS EN 60862-1:2015

Действует

Surface acoustic wave (SAW) filters of assessed quality. Generic specification — 50 стр.

BS IEC 62615:2010

Действует

Electrostatic discharge sensitivity testing. Transmission line pulse (TLP). Component level — 24 стр.

OVE EN 62575-1:2016-11

Действует

Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality -- Part 1: Generic specification (IEC 62575-1:2015) (english version)

OVE EN 60749-43:2020-01

Действует

Semiconductor devices - Mechanical and climatic test methods -- Part 43: Guidelines for IC reliability qualification plans (IEC 60749-43:2017) (english version)

OVE EN 62604-1:2016-05

Действует

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality -- Part 1: Generic specification (IEC 62604-1:2015) (english version)

IEC 60749-28:2022 ed2.0

Действует

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level — 98 стр.

IEC PAS 62162:2000 ed1.0

Заменен

Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components — 7 стр.

IEC 60749-3:2002 ed1.0

Заменен

Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual inspection — 7 стр.