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IEC PAS 62162:2000 ed1.0

Заменен
Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components — 7 стр.
Describes a uniform method for establishing charged-device model (CDM) electrostatic discharge (ESD) withstand thresholds. All packages semiconductor components, thin film circuits, surface acoustic wave (SAW) components, opto-electronic components, hybrid integrated circuits (HICS), and multi-chip modules (MCMs) containing any of these components are to be evaluated according to this standard. IEC/PAS 62162 will be re-issued in the form of IEC international standard under reference IEC 60748-20.
ICS
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом