IEC PAS 62162:2000 ed1.0

Заменен

Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components — 7 стр.

Описание Изменения Ссылки Версии

Ссылочные документы

IEC 60749-28:2017 ed1.0

Заменен

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level — 97 стр.

На этот документ ссылаются

IEC 60749-28:2017 ed1.0

Заменен

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level — 97 стр.

IEC TR 62153-4-1:2010 ed2.0

Заменен

Metallic communication cable test methods - Part 4-1: Electromagnetic compatibility (EMC) - Introduction to electromagnetic (EMC) screening measurements — 72 стр.