IEC 60749-43:2017 ed1.0

Заменен

Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans — 74 стр.

Описание Изменения Ссылки Версии

IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.

Заменен на

IEC 63287-1:2021 ed1.0

ICS

31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом