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IEC 60749-5:2017 ed2.0

Заменен
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test — 9 стр.
ОписаниеИзмененияСсылкиВерсии

Ссылочные документы

IEC 60749-5:2023 ed3.0
Действует
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test — 17 стр.
IEC 60805:1985 ed1.0
Заменен
Guide for commissioning, operation and maintenance of storage pumps and of pump-turbines operating as pumps — 47 стр.
IEC 60749-5:2003 ed1.0
Заменен
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test — 13 стр.

На этот документ ссылаются

DIN EN 60749-4:2003-04
Отменен
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (IEC 60749-4:2002); German version EN 60749-4:2002 — 9 стр.
DIN EN 60749-4:2017-11
Действует
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (IEC 60749-4:2017); German version EN 60749-4:2017 — 12 стр.
BS EN 60749-43:2017
Действует
Semiconductor devices - Mechanical and climatic test methods. Guidelines for IC reliability qualification plans — 42 стр.
ÖVE/ÖNORM EN 60747-15:2012-10
Действует
Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices (IEC 60747-15:2010) (english version)
ÖVE/ÖNORM EN 62047-5:2012-05
Действует
Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches (IEC 62047-5:2011) (english version)
ÖVE/ÖNORM EN 60749-30:2012-02
Действует
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2005 + A1:2011) (english version)
OVE EN 60749-4:2017-12
Действует
Semiconductor devices - Mechanical and climatic test methods -- Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (IEC 60749-4:2017) (english version)
OVE EN 60749-43:2020-01
Действует
Semiconductor devices - Mechanical and climatic test methods -- Part 43: Guidelines for IC reliability qualification plans (IEC 60749-43:2017) (english version)
IEC 60749-5:2023 ed3.0
Действует
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test — 17 стр.
IEC 60749-5:2003 ed1.0
Заменен
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test — 13 стр.
IEC 60749-12:2002 ed1.0
Заменен
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency — 7 стр.