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IEC PAS 62163:2000 ed1.0

Заменен
External visual test method — 3 стр.
The purpose of this examination is to verify that the materials, design, construction, markings, and workmanship of the device are in accordance with the applicable procurement document. External Visual is a non-destructive test and applicable for all package types.
ICS
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом