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ASTM
ASTM E1438-11(2019)
Действует
Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS — 3 стр.
ASTM D3004-08(2020)
Действует
Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting, Conductor, and Insulation Shielding Materials — 2 стр.
ASTM F980-16(2024)
Действует
Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices — 7 стр.
ASTM D6095-12(2023)
Действует
Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials — 3 стр.