Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics— 28 стр.
Standard Guide for Use of an X-Ray Tester ("48;10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits— 18 стр.
Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices— 19 стр.
Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices— 10 стр.
Standard Practice for Laser Technologies for Measurement of Cross-Sectional Shape of Pipeline and Conduit by Non-Rotating Laser Projector, Infrared Measurement, and CCTV Camera System— 6 стр.
Standard Practice for Laser Technologies for Direct Measurement of Cross Sectional Shape of Pipeline and Conduit by Rotating Laser Diodes and CCTV Camera System— 5 стр.
Standard Practice for Use of a Calibration Device to Demonstrate the Inspection Capability of an Interferometric Laser Imaging Nondestructive Tire Inspection System— 3 стр.
