Стандарты ASTM. 31 Electronics / Электроника

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Действует

Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices — 12 стр.

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Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts — 3 стр.

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Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates — 13 стр.

Действует

Standard Classification System and Basis for Specification for Liquid Crystal Polymers Molding and Extrusion Materials (LCP) — 7 стр.

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