Стандарты ASTM. 31.080 Semiconductor devices / Полупроводниковые приборы

Действует

Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics — 28 стр.

ASTM F1892-12(2018)

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Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices — 41 стр.

ASTM E1161-21

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Standard Practice for Radiographic Examination of Semiconductors and Electronic Components — 11 стр.

ASTM E431-96(2022)

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Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices — 7 стр.

ASTM F1190-24

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Standard Guide for Neutron Irradiation of Unbiased Electronic Components — 6 стр.

ASTM F1192-24

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Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices — 12 стр.