Standard Guide for Use of an X-Ray Tester ("48;10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits— 18 стр.
Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices— 19 стр.
Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices— 10 стр.
