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OVE EN 62276:2017-10
Действует
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods ( IEC 62276:2016) (english version)
OVE EN 62884-1:2018-03
Действует
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators -- Part 1: Basic methods for the measurement (IEC 62884-1:2017) (english version)
OVE EN 60758:2017-05
Действует
Synthetic quartz crystal - Specifications and guidelines for use ( IEC 60758:2016) (english version)
OVE EN 60444-8:2017-12
Действует
Measurement of quartz crystal unit parameters -- Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2016) (english version)
OVE EN IEC 60122-4:2019-11
Действует
Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors (IEC 60122-4:2019) (english version)
OVE EN IEC 62884-4:2020-03
Действует
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators -- Part 4 : Short-term frequency stability test methods ((IEC 62884-4:2019) EN IEC 62884-4:2019) (english version)
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