Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules ( IEC 61240:2016) (english version)
Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) (IEC 62761:2014) (english version)
Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction (IEC 60444-11:2010) (english version)
Measurements and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values (IEC 60689:2008) (english version)
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines (IEC 61837-1:2012) (english version)
Waveguide type dielectric resonators -- Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency (IEC 61338-1-5:2015) (english version)
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections -- Part 3: Metal enclosures (IEC 61837-3:2015) (english version)
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections -- Part 4: Hybrid enclosure outlines (IEC 61837-4:2015) (english version)
