Semiconductor devices - Micro-electromechanical devices - Part 11: Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems (IEC 62047-11:2013) (english version)
Semiconductor devices - Micro-electromechanical devices -- Part 17: Bulge test method for measuring mechanical properties of thin films (IEC 62047-17:2015) (english version)
Connectors for electronic equipment -- Part 7-81: Detail specification for 8-way, shielded, free and fixed connectors, for data transmissions with frequencies up to 2 000 MHz (IEC 60603-7-81:2015) (english version)
Connectors for electronic equipment -- Part 7-81: Detail specification for 8-way, shielded, free and fixed connectors, for data transmissions with frequencies up to 2 000 MHz (IEC 60603-7-81:2015/COR1:2017) (Corrigendum) (english version)
Connectors for electronic equipment -- Part 7-82: Detail specification for 8-way, 12 contacts, shielded, free and fixed connectors, for data transmission with frequencies up to 2 000 MHz (IEC 60603-7-82:2016) (english version)
Connectors for electronic equipment - Product requirements -- Part 2-113: Circular connectors - Detail specification for connectors with M12 screw locking with power and signal contacts for data transmission with frequency up to 100 MHz (IEC 61076-2-113:2017) (english version)
Connectors for electronic equipment - Product requirements -- Part 3-110: Detail specification for free and fixed connectors for data transmission with frequencies up to 3 000 MHz (IEC 61076-3-110:2016) (english version)
Connectors for electronic equipment - Tests and measurements - Part 9-2: Endurance tests - Test 9b: Electrical load and temperature (IEC 60512-9-2:2011) (english version)
Connectors for electronic equipment - Tests and measurements - Part 15-4: Connector tests (mechanical) - Test 15d: Contact insertion, release and extraction force (IEC 60512-15-4:2008) (english version)
Connectors for electronic equipment - Tests and measurements - Part 16-11: Mechanical tests on contacts and terminations - Test 16k: Stripping force, solderless wrapped connections (IEC 60512-16-11:2008) (english version)
Connectors for electronic equipment - Tests and measurements - Part 16-5: Mechanical tests on contacts and terminations - Test 16e: Gauge retention force (resilient contacts) (IEC 60512-16-5:2008) (english version)
Connectors for electronic equipment - Product requirements - Part 3-115: Rectangular connectors - Detail specification for protective housings for use with 8-way shielded and unshielded connectors for frequencies up to 600 MHz for industrial environments incorporating the IEC 60603-7 series interface - Variant 12 related to IEC 61076-3-106 - Push-pull type (IEC 61076-3-115:2009) (english version)
Connectors for electronic equipment - Tests and measurements - Part 7-1: Impact tests (free connectors) - Test 7a: Free fall (repeated) (IEC 60512-7-1:2010) (english version)
Connectors for electronic equipment - Tests and measurements - Part 99-001: Test schedule for engaging and separating connectors under electrical load - Test 99a: Connectors used in twisted pair communication cabling with remote power (IEC 60512-99-001:2012) (english version)
Connectors for electronic equipment - Part 7-2: Detail specification for 8-way, unshielded, free and fixed connectors, for data transmissions with frequencies up to 100 MHz (IEC 60603-7-2:2010) (english version)
