DIN 50433-3:1982-04

Отменен

Testing of materials for semiconductor technology; determination of the orientation of single crystals by means of Laue back scattering — 8 стр.

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DIN 50433-1:1976-12

Отменен

Testing of semi-conducting inorganic materials; determining the orientation of single crystals by means of X-ray diffraction — 3 стр.

DIN 50433-2:1976-12

Отменен

Testing of semi-conducting inorganic materials; determining the orientation of single crystals by means of optical reflection figure — 4 стр.

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DIN 50443-1:1988-07

Отменен

Testing of materials for use in semiconductor technology; detection of crystal defects and inhomogeneities in silicon single crystals by X-ray topography — 10 стр.

DIN 50443-2:1994-06

Отменен

Testing of materials for semiconductor technology; recognition of defects and inhomogeneities in semiconductor single crystals by X-ray topography; III-V-semiconductor compounds — 7 стр.